|
| Part Numbert | Mfg | Packt | D/C | Descriptiont | Qty | Company/Contact | |
| 9494-2-4039 | EBM-PAPST | 94 |
|
 |
|
9494-2-4039 Datasheet NOTES: 5632 tbl 10 1. At f = fMAX, address and control lines (except Output Enable) are cycling at the maximum frequency read cycle of l/tRC, using "AC TEST CONDITIONS" at input levels of GND t0 3.3V. 2. f = 0 means no address or control lines change. Applies only to input at CMOS level standby. 3. Port "A" may be either left or right port. Port "B" is the opposite from port "A". 4. VDD = 3.3V, TA = 25'C for Typ, and are not production tested. IDD Dc(0) = 100mA (Typ). 5. CEx = VIL means CEox = VIL and CEix = VIH CEx = VIH means CEox = VIH or CEix = VIL CEx < 0.2V means CEox < 0.2V and CEix VDDOX - 0.2V CEx > VODOX - 0.2V means CEox > VDDOX - 0.2V or CEix < 0.2V. "X" represents "L" for left port or "R" for right port. 6. ISBl, ISB2 and ISB4 will all reach full standby levels (ISB3) on the appropriate port(s) if ZZL and /or ZZR = VIH. 7. 8ns Commercial and 10ns Industrial speed grades are available in BF-208 and BC-256 packages only. 9494-2-4039 Price All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner. The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent- or other industrial or intellectual property rights. 9494-2-4039 on stock Static tests at Static tests at Static tests at Dynamic tests at Dynamic tests at Dynamic tests at Functional tests at Functional tests at Functional tests at Switching tests at Switching tests at Switching tests at
0 0 1 m . ( e ' 0 q i Z . ( i l q i Z o N V O d v i I - I V V J N a I S N X m |
