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N74F257ADR Datasheet
No te. Even if the thermo-elecVic cooler (TEC) is operated within the rate d conditions, unconVolled current loading or operation without heatsink may easily damage the mod ule by exceeding the storage temperature range. Th errnistor resistan ce should be properly monitored by the feedback crcuit during TE C operation to avoid the catastrophic damage.
N74F257ADR Price

l l l VDS= 10V
|[ i=l mA
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N74F257ADR on stock

Vcc=2.7V ~ 3.6V Vcc=3.6V ~ 5.5V
Parameter Symbol Test Conditions Min Typ Max Min Typ Max Unit
Sequential Read lccl tRC=80ns, CE=ViL, IOUT=OmA 10 20 15 30
Operating Current Program lcc2 10 20 15 30 mA
Erase lcc3 10 20 25 40
Stand-by Current(TTL) ISB1 CE=VIH, WP=SE=OVNcc 1 1
Stand-by Current(CMOS) ISB2 CE=Vcc-0.2, WP=SE=OVNcc 10 50 10 50
Input Leakage Current h_l VIN=O t0 5.5V ±10 ±10 uA
Output Leakage Current ILO VOUT=O t0 5.5V ±10 ±10
1/0 pins 2 0 VccQ+0.3 3.0 VccQ+0.5 V
Input High Voltage VIH Except l/0 pins 2 0 Vcc+0.3 3O Vcc+0.5
Input Low Voltage, All inputs VIL -0.3 0 6 -0.3 0.8
Output High Voltage Level VOH IOH=-40011A 2 4 2.4
Output Low Voltage Level VOL IOL=2.1mA 0.4 0.4
Output Low Current(R/B) IoL(R/B) VOL=0.4V 8 10 8 10 mA


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