| TEST | PROCEDURE | REQUIREMENTS |
| NAME OF TEST | REFERENCE | (quick reference) |
| Endurance | IEC 384-4/ CECC 30300 subclause 4.13 | Tamb = 85 IC; UR applied; 2000 hours | CC/C: +1 0% tan 8 " 2 x spec. limit IL5 " spec. limit |
| Load life | | Taryib = 85 IC; UR and IR applied; 2000 hours | q~C/C: +10% tan 8 " 2 x spec. limit IL5 " spec. limit |
| Useful life | CECC 30301 subclause l.8.1 | Tamb = 85 IC; UR and IR applied; 2500 hours | CC/C: +30% tan 8 " 3 x spec. limit IL5 " spec. limit no short or open circuit, no visible damage total failure percentage: " 3% |
| Shelf life (storage at high temperature) | IEC 384-4/ CECC 30300 subclause 4.17 | Tamb = 85 IC; no voltage applied; 1000 hours after test: UR to be applied for 30 minutes, 24 t0 48 hours before measurement | CC/C: +1 5% tan 8 " 1.5 x spec. limit IL5 " 1 x spec. limit |
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N80C132J8-1 on stock Low Power: Icc = 120aA Max with Driver Disabled ICC = 5000<A Max with Driver Enabled, No Load 1 Quiescent Current in Shutdown Mode Controlled Slew Rate Driver for Reduced EMI Single 5V Supply Drivers/Receivers Have +lOkV ESD Protection -7V t0 12V Common-Mode Range Permits +7V Ground Difference Between Devices on the Data Line Thermal Shutdown Protection Power Up/Down Glitch-Free Driver Outputs Permit Live Insertion or Removal of Transceiver Driver Maintains High Impedance in Three-State or with the Power Off Up t0 32 Transceivers on the Bus Pin Compatible with the LTC485
