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N80C527953 Datasheet

Table 73. EPF10K200S Device Internal & External Timing Parameters Note ( 7)
Symbol	1 Speed Grade		-2 Speed Grade		-3 Speed Grade		Unit
Symbol	Min	Max	Min	Max	Min	Max	Unit
tLUT		0 7		0.8		1 2	ns
tCLUT		0 4		0.5		0 6	ns
tRLUT		0 5		0.7		0 9	ns
LPAcKED		0 4		0.5		0 7	ns
tEN		0 6		0.5		0 6	ns
tclc0		0 1		0.2		0 3	ns
'CGE		0 3		0.4		0 6	ns
'CGE		0 1		0.2		0 3	ns
tCASC		0 7		0.8		1 2	ns
tc		0 5		0.6		0 8	ns
tCo		0 5		0.6		0 8	ns
'COMB		0 3		0.6		0 8	ns
tSU	0 4		0.6		0 7		ns
tH	1 0		1.1		1 5		ns
tPRE		0 4		0.6		0 8	ns
tCLR		0 5		0.6		0 8	ns
tCH	2 0		2.5		3 0		ns
tCL	2 0		2.5		3 0		ns

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memory location. An on line assembler/disassem- bler is also available to ease debugging. An important feature of the ST7 development sys- tem is that true source level debugging is possible, meaning code may be viewed at source level and breakpoints may be set on high level code, rather than on disassembled target code. This is much more meaningful to the user and ensures a more convivial and productive development environ- ment.
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Parameter	Test Conditions	Symbol	Min	Typ	Max	Unit
Luminous Intensity	IF=lOmA	IV	8.0	28		mcd
Forward Voltage	IF=20mA	VF		2.0	2.8	V
Reverse Current	VR=5V	IR			100	A
Wavelength	IF=20mA	p		640		nm
Spectral Line Half Width	IF=20mA			40		nm
Viewing Angle	IF=20mA	20li2		20		deg

		t

		l -.fnr,			KAH7
	j	measurement
		] LA7975 I

j		750~	{}	l
		750~	{}	7
	Uni	t (resistance: (	,Vcc=9V , capacitance: F)

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