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N82S100BXA Datasheet

PARAMETER	SYMBOL	CONDITIONS		MIN TYP MAX	UNITS
Input Offset Voltage	VOs	VOUT = OV, RL =		1 8	mV
Input Offset Voltage Match Between Channels		VOUT = OV, RL =		1 6	mV
Input Offset Voltage Drift	TCVos	VOUT = OV, RL = 1501		30	pV/oc
Input Bias Current	lB	VOUT = OV, RL = 150l , VCM = OV		4 5 10	pA
Common-Mode Input Resistance	RIN(CM)	MAX4136, either input		5	MI
Common-Mode Input Capacitance	CIN(CM)	MAX4136, either input		2	pF
		f= 1MHz		7	n Vl fbAz
Input Voltage Noise	en	f= 1MHz t0 100MHz		88	LJVRMS
		f= 1MHz		2 4	pAl 6h~z
Input Current Noise	in	f= 1MHz t0 100MHz		30	nARMS
Input Capacitance	CIN			2	pF
Common-Mode Input Voltage Range	VCM	MAX4136		±2 5	V
Common-Mode Rejection Rati	CMRR	MAX4136, VCM = +2.5V		60	dB
Power-Supply Rejection Rati	PSRR	Vs = +4.75V to +5.25V		55 65	dB
			All channels off	45 55
Quiescent Supply Current	lsY	VIN= OV	All channels on	70 80	mA
			Positive	+2.2 +2.6	V
Output Voltage Swing	VOUT	RL= 150l	Negative	-2.0 -2.5	V
Output Current Drive	IOUT	RL= 30		45 65	mA
SEL High Threshold	VIH			2 0	V
SEL Low Threshold	VIL			0 8	V
SEL Input Current	iSEL			1 5	pA

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IRID	TVJ = TVJM; VR = VRRM; VD = VDRM	5	mA
VT	IT = 20 A; TVJ = 25IC	1.6	V
VTO	For power-loss calculations only (TVJ = 125IC)	0.85	V
rr	For power-loss calculations only (TVJ = 125IC)	27	ml
VGT IGT	VD = 6 V; TVJ = 25IC TVJ = -40IC VD = 6 V; TVJ = 25IC TVJ = -40IC	1.5 2.5 28 50	V V mA mA
VGD IGD	TVJ = TVJM; VD = 2/3 VDRM	0.2 3	V mA
IL	TVJ = 25IC; tp = 10 ~s IG = 0.1 A; diG/dt = 0.1 A/~s	75	mA
IH	TVJ = 25IC; VD = 6 V; RGK =	50	mA
tgd	TVJ = 25IC; VD = 1/2 VDRM	2

N82S100BXA on stock

*MULTSELl/REF1 VDD CPU CPUO:1, CPUO:1# VDD_REF X1 X2 GND PCI *FS2/PCI_FO VDD MREF *FS3/PCI_F1 3VMREF,3VMREF# *MODE/PCI_F2 VDD PCI VDD_3V66 *FS4/PCIO 3V66 0:3 PCI1 PC12 GND PCI VDD_PCI PC13 PCI F0:2 PC14 PC10:6 PC15 PC16 VDD PCI VTT PWRGD# RST# GND_48MHz *FS0/48MHz *FSl/24_48MHz VDD_48MHz VDD_48MHz 48MHz

Note: 1. Stresses greater than those listed under absolute maximum ratings may cause permanent damage to the device. This is intended to be a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operation sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.

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