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NACER47M50V4X5.5TR13 Datasheet

INPUTS						LATCH	OUTPUTS		OPERATING MODE
An	Bn+	LE	OEA	OEB	OEB	STATE	An	Bn	OPERATING MODE
H	x	L	L			H	Z	L	A 3-state, data from A to B
L	x	L	L	L	L	L	Z	H++	A 3-state, data from A to B
x	x	H	L	L	L	Qn	Z	Qn	A 3-state, latched data to B
		L	H	L	L	(1)	(1)	(1)	Feedback: A to B, B to A
	H	H	H	L	L	H (2)	H	2(2)	Preconditioned latch enabling data transfer from B to A
	L	H	H	L	L	H (2)	L	2(2)	Preconditioned latch enabling data transfer from B to A
		H	H	L	L	Qn	Qn	Qn	Latch state to A and B
H	x	L	L	H	x	H	Z	Z
l	x	L	L	H	x	I	Z	Z	B and A 3-state
x	x	H	L	H	x	Qn	Z	Z	B and A 3-state
	H	L	H	H	x	H	H	Z
	L	L	H	H	H	L	L	Z	B 3-state, data from B to A
	H	H	H	H	H	Qn	H	Z
	L	H	H	H	H	Qn	L	Z
H	x	L	L	x	H	H	Z	Z
l	x	L	L	x	H	I	Z	Z	B and A 3-state
x	x	H	L	x	H	Qn	Z	Z	B and A 3-state
	H	L	H	x	H	H	H	Z
	L	L	H	x	H	L	L	Z	B 3-state, data from B to A
	H	H	H	x	H	Qn	H	Z
	L	H	H	x	H	Qn	L	Z

NACER47M50V4X5.5TR13 Price

TC4015B contains two circuits of 4 stage shift registers and the independent output is drived from each stage. As all the D type flip-flops of every stage have common RESET input, asynchronous clear operation can be achieved by an external signal at arbitrary timing. The flip-flop of each stage is triggered by rising edge of CLOCK input. R.ESET input of"H"level resets the contents of all the stages to " L " regardless of CLOCK and DATA inputs and all of data outputs Ql through Q4 become " L ". This can be used for converting serial data to palallel one and for ring counters of any numbering systems.
NACER47M50V4X5.5TR13 on stock

VOLPNOLV and VOHPNOHV: Determine the quiet output pin that demonstrates the greatest noise levels. The worst case pin will usually be the furthest from the ground pin. Monitor the output volt- ages using a sol coaxial cable plugged into a standard SMB type connector on the test fixture. Do not use an active FET probe. Measure VOLP and VOLV on the quiet output during the worst case transition for active and enable. Measure VOHP and VOHV on the quiet output during the worst case transition. Verify that the GND reference recorded on the oscillo- scope has not drifted to ensure the accuracy and repeat- ability of the measurements. VILD arid VIHD: Monitor one of the switching outputs using a sol coaxial cable plugged into a standard SMB type connector on the test fixture. Do not use an active FET probe. First increase the input LOW voltage level, VIL, until the output begins to oscillate or steps out a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds VIL limits, or on output HIGH levels that exceed VIH limits. The input LOW voltage level at which oscillation occurs is defined as VILD. Next decrease the input HIGH voltage level, VIH, until the output begins to oscillate or steps out a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds VIL limits, or on output HIGH levels that exceed VIH limits. The input HIGH voltage level at which oscillation occurs is defined as VIHD. Verify that the GND reference recorded on the oscillo- scope has not drifted to ensure the accuracy and repeat- ability of the measurements. vcc

The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk.

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