| VDS = 10V IDS = 1.2A | | | | |
| f = 4.2GHz Af = 10MHz | | | | |
| 2 to | ie te | st | P | | | |
| | | | | | j | |
| | | | IM3 | | | |
| | | _ | | | | |
| | | | | | | |
| | | | | | |
K9F2808QOB (1.8V device) - Changed typical read operation current (lccl) from 8mA t0 5mA Jul. 30th 2001 - Changed typical program operation current (Icc2) from 8mA t0 5mA - Changed typical erase operation current (Icc3) from 8mA t0 5mA - Changed typical program time(tPROG) from 200us t0 300us - Changed ALE to RE Delay (ID read, tARl) from 100ns t0 20ns - Changed CLE hold time(tCLH) from 10ns t0 15ns - Changed ~E hold time(tCH) from 10ns t0 15ns - Changed ALE hold time(tALH) from 10ns t0 15ns - Changed Data hold time(tDH) from 10ns t0 15ns - Changed CE Access time(tCEA) from 45ns t0 60ns - Changed Read cycle time(tRC) from 50ns t0 70ns - Changed Write Cycle time(tWC) from 50ns t0 70ns - Changed RE Access time(tREA) from 35ns t0 40ns - Changed RE High Hold time(tREH) from 15ns t0 20ns - Changed WE High Hold time(tWH) from 15ns t0 20ns
