QW-4SOIC28 Datasheet| Parameter | Symbol | Test condition | Grade | MIN | MAX. | Unit | Notes | | Operating current | lcci | Burst length = 1 | /CAS latency = 2 | -A75 | | 2 200 | mA | 1 | | tRC > tRC (MIN ), lo = 0 rriA | /CAS latency = 3 | -A75 | | 2 290 | | Precharge standby current in | Icc2P | CKE " VUMAX ), tCK = 15 ns | | 268 | mA | | | power down mode | lcc2PS | CKE " VIL [MAX ), tCK = | | 98 | | Precharge standby current in non power down mode | lcc2N | CKE > VIH [MIN }, tCK = 15 ns, /CS > VIH (MIN }, Input signals are changed one time during 30 ns. | | 610 | mA | | | lcc2NS | CKE > VIH [MIN }, tCK = o , Input signals are stable. | | 224 | | Active standby current in | ICC3P | CKE " VIL [MAX ), tCK = 15 ns | | 340 | mA | | | power down mode | ICC3PS | CKE " VUMAX), tCK = | | 152 | | Active standby current in non power down mode | ICC3N | CKE > VIH (MIN ), tCK = 15 [1S, /CS > VIH (MIN }, Input signals are changed one time during 30 ns. | | 790 | mA | | | ICC3NS | CKE > VIH (MIN ), tCK = o , Input signals are stable. | | 440 | | Operating current | ICC4 | tCK > tCK (MIN ), lo = 0 mA | /CAS latency = 2 | -A75 | | 2 290 | mA | 2 | | (Burst mode) | /CAS latency = 3 | -A75 | | 2 920 | | CBR (Auto) Refresh current | lccs | tRC > tRC (MIN ) | /CAS latency = 2 | -A75 | | 4 540 | mA | 3 | | /CAS latency = 3 | -A75 | | 4 720 | | Self refresh current | ICC6 | CKE0.2V | | 286 | mA | | | Input leakage current | li(L) | VI = 0 t0 3.6 V, All other pins not under test = 0 V | -20 | +20 | oA | | | Output leakage current | laL1 | Dou r iS disabled, Vo = 0 t0 3.6 V | -1.5 | +1.5 | oA | | | High level output voltage | VOH | lo= -4.0 mA | 2.4 | | V | | | Low level output voltage | VOL | lo= +4.0 mA | | 0.4 | V | | | | | | | | | | |
QW-4SOIC28 Price| Transition frequency /C = 80 mA, VCE = 3 V, f = 1 GHz | fT | | 37 | | GHz | | Collector-base capacitance VCB = 3 V, f =1 MHz | Ccb | | 0.26 | | pF | | Collector emitter capacitance VCE = 3 V, f =1 MHz | Cce | | 0.45 | | | Emitter-base capacitance VEB = 0.5 V, f = 1 MHz | Ceb | | 1.1 | | | Noise figure /C = 10 mA, VCE = 3 V, f = 1.8 GHz, Zs = ZSopt /C = 10 mA, VCE = 3 V, f = 6 GHz, Zs = ZSopt | F | | 0.8 1.9 | | dB | | Power gain, maximum availablei) /C = 80 mA, VCE = 3 V, Zs = ZSopt, ZL = ZLopt, f = 1.8 GHz /C = 80 mA, VCE = 3 V, Zs = ZSopt, ZL = ZLopt, f = 6 GHz | Gma | | 21 10.5 | | | Transducer gain /C = 80 mA, VCE = 3 V, Zs = ZL = 50 Q, f = 1.8 GHz /C = 80 mA, VCE = 3 V, Zs = ZL = 50 Q, f = 6GHz | IS21el2 | | 1 7 6 | | dB | | Third order intercept point at output2) VCE = 3 V, lc = 80 mA, f = 1.8 GHz, ZS = ZL = 50 Q | tP3 | | 29.5 | | dBm | | 1dB Compression point at output /C = 80 mA, VCE = 3 V, Zs = ZL = 50 Q, f = 1.8 GHz | P-ldB | | 1 8 | | | | | | | |
QW-4SOIC28 on stock Environmentol SPecifiicotion SoIdering Techniques & Compotibility Infrared Reflow: 240~:, 20 sec max. Wave Solder: 2600C, 1 0 sec max. (MIL-STD-202, Method 2 1 0) Operating TemPerature -550C to +1250C Shock MIL-STD-202, Method 21 3,Test Condition I (IOO G's peak for 6 milliseconds) Vibration MIL-STD-202, Method 20 1 (1 0-55 Hz, 0.06 inch, total excursion) Solt Spray MIL-STD-202, Method IOI,Test Condition B (48Hrs) Insulation Resistonce MIL-STD-202, Method 302,Test ConditionA (After Opening) 10,000 0hms minimum SoIderability MIL-STD-202, Method 208 Resistance to Solder Heat MIL-STD-202, Method 210,Test Condition B (260IC, 10 sec) ThermaI Shock MIL-STD-202, Method 107, Test Condition B (-650C to +1250C) | Input ' .;' .Output Output ' Model . ' Voltage . . ;Voltage .Curferit :' Number . | | 9-36 5 300 LANC2405UW 12 125 LANC2412UW 15 100 LANC2415UW .. 20-72 . ' '5 ; . '300 . .LANC4805UW . .12 . . ' T25. ' ;LANC4812UW . 15 ' ' . ';.= ;100 ..': T LANC4815UW . 9-36 5 500 . LANC2405UW3 12 250 LANC2412UW3 15 200 LANC2415UW3 . . 20-72- . - 5 ' .. ; /; . 500;; ; : LANC4805UW3 12 ' ' . 250:: ' :-LANC4812UW3.;: ' 15 ' . ' 200 " LANC4815UW3 : |
|
