NOTES: 1. WE must be high during address transitions. 2. The internal write time of the memory is defined by the overlap of CE2, E~ and WE low. All signals must be active to initiate a write and any one signal can terminate a write by going inactive. The data input setup and hold timing should be referenced to the second transition edge of the signal that terminates the write. 3. TWR is measured from the earlier of CE2 going low, or ~E1 0r WE going high at the end of write cycle. 4. During this period, DQ pins are in the output state so that the input signals of opposite phase to the outputs must not be applied. 5. If the CE2 high transition or ~E~ low transition or LB UB low transition occurs simultaneously with the WE low transitions or after the WE transition, output remain in a high impedance state. 6. OE is continuously low COE = VIL ). 7. Dou r iS the same phase of write data of this write cycle. 8. DOUT is the read data of next address. 9. If CE2 is high or CE~ is low during this period, DQ pins are in the output state. Then the data input signals of opposite phase to the outputs must not be applied to them. 10. Transition is measured+ 500mV from steady state with CL = 30pF as shown in Figure lB. The parameter is guaranteed but not 100% tested. 11. Tcw iS measured from the later of CE2 going high orjEl, going low to the end of write.
RSE-024 on stock| | At Any Rated Load Condition - And With Rated V RRMApplied. r_ii_.^twingiSlnr Jrgf |
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| | | | | | | | IIIII TJ=TJ max 8 3ms SINGLE HALF SINE-WAVE 'JEDEC Methodl | |
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