TPST76818QPWP Datasheet| EF | | | CEF | | t | | | | | | | | c-tREA+ | | | | 1 tE | | | | r | | | In I/UU-I r | + | | \ UUL j igure 28. Read Operation with CEF don't-care. CLE I I ------- . .[. -. , . CEFdon't-care | | CEF | | | | | | | | | J 1 ,. | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | |
TPST76818QPWP Price| PACKAGE | TA <25YC | DERATING FACTOR | TA= 70YC | TA= 85YC | | POWER RATING | ABOVE TA = 25YC | POWER RATING | POWER RATING | | DCK | 321 mW | 2.6 mW/YC | 206 mW | 167 mW | | | | | |
TPST76818QPWP on stock Setting the BUSY bit in the PSW register causes the MICROWIRE/PLUS to start shifting the data. It gets reset when eight data bits have been shifted. The user may reset the BUSY bit by software to allow less than 8 bits to shift. The device may enter the MICROWIRE/PLUS mode either as a Master or as a Slave. Figure 5 shows how two micro- controllers and several peripherals may be interconnected using the MICROWIRE/PLUS arrangement. | Qualification Test | Test Method and Test Conditions | Test Length | Samples | Comments | | Biased Humidity (HAST) | JESD22-A101, TA = 850C, RH = 85% | 1000 hrs | 77 | Vcc = VOUT = 3.3 V | | High-Temperature Operating Life (HTOL) | JESD22-A108, TA = 1500C, Tj = 1650C | 1000 hrs | 77 | | | Accelerated HTOL | TA = 1700C, Tj = 1800C | 168 hrs | 77 | | | Autoclave, Unbiased | JESD22-A102, Condition C, | 96 hrs | 77 | | | High-Temperature (Bake) Storage Life | MIL-STD-883, Method 1008, TA = 1700C | 1000 hrs | 77 | | | Temperature Cycle | MIL-STD-883, Method 1010, -550C to +1500C | 1000 cycles | 77 | | | ESD, Human Body Model | CDF-AEC-Q100-002 | Pre/Post Reading | X per test | Test to failure, Allleads > TBD | | | | | |
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