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TR09BFSHA171N-DB AGERE        1347 
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TR09BFSHA171N-DB AGERE    125  New&Original  1347 

TR09BFSHA171N-DB Datasheet
Large negative transients occurring at the inputs of memory devices (DRAMs, SRAMs, EPROMs, etc.) or on the CLOCK lines of many clocked devices can result in improper operation of the devices. The SN74F1018 diode termination array helps suppress negative transients caused by transmission line reflections, crosstalk,and switching noise.
TR09BFSHA171N-DB Price
PackageTypes The standard package for the NX25P1 0/20/40 is an 8-pin plastic SOIC with 150 mil body (NexFlash package code N). It also allows a package migration path to higher density Serial Flash devices. The pinout for the "N" package is shown in Figure 2. Package diagrams and dimensions are illustrated at the end of this data sheet. Optional 8-contact
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The REG103 has very low output noise (typically 33ccVrms for VOUT = 3.3V with CNR = O.OlccF), making it ideal for use in portable communications equipment. On-chip trimming results in high output voltage accuracy. Accuracy is main- tained over temperature, line, and load variations. Key parameters are tested over the specified temperature range (-40IC to +85IC). The S0-8 version of the REG103 has an ERROR pin that provides a "power good" flag, indicating the regulator is in regulation. The REG103 is well protected-internal cir- cuitry provides a current limit that protects the load from damage. Thermal protection circuitry keeps the chip from being damaged by excessive temperature. In addition to the S0-8 package, the REG103 is also available in the DDPAK and the SOT223-5.

Characteristics Symbol Test Condition Min Typ. Max Unit
Zener voltage VZ lZ=5mA 6 5 6 8 7 1 V
Dynamic impedance ZZ 17=5 mA 50 Q
Knee dynamic impedance ZZK lZ= 0.5 mA 100 Q
Reverse current JR VR=5V 0 5 uA
Total capacitance CT VR=OV,f=l MHz 6 0 pF